Organic solar cell degradation probed by the nanosecond photoresponse
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Abstract
We measure the transient electrical response of small organic solar cells illuminated with nanosecond light pulses during degradation. Our data show the buildup of a significant memory effect in the pulse response. To measure this memory effect, a sequence of positive or negative bias voltages is applied and the pulse response is then recorded at 0-V bias voltage. For devices with a measurable memory effect, this pulse response depends on the previously applied positive or negative bias voltage. The memory effect is attributed to changes in the (3,4-ethylenedioxythiophene):poly (4-styrenesulfonate) (PEDOT:PSS) layer in conjunction with humidity and the indium tin oxide (ITO) layer. The strength of the memory effect depends on the anode material used and the time exposed to humid atmosphere. Therefore, the strength of this memory effect is a measure for the corresponding degradation process.
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Organic solar cell degradation probed by the nanosecond photoresponse</title><author><name sortKey="Kettlitz, S W" uniqKey="Kettlitz S">S. W. Kettlitz</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Lichttechnisches Institut, Karlsruhe Institute of Technology (KIT), Kaiserstr. 12</s1><s2>76131 Karlsruhe</s2><s3>DEU</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Allemagne</country><placeName><region type="land" nuts="1">Bade-Wurtemberg</region><region type="district" nuts="2">District de Karlsruhe</region><settlement type="city">Karlsruhe</settlement></placeName></affiliation></author><author><name sortKey="Valouch, S" uniqKey="Valouch S">S. Valouch</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Lichttechnisches Institut, Karlsruhe Institute of Technology (KIT), Kaiserstr. 12</s1><s2>76131 Karlsruhe</s2><s3>DEU</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Allemagne</country><placeName><region type="land" nuts="1">Bade-Wurtemberg</region><region type="district" nuts="2">District de Karlsruhe</region><settlement type="city">Karlsruhe</settlement></placeName></affiliation></author><author><name sortKey="Lemmer, U" uniqKey="Lemmer U">U. Lemmer</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Lichttechnisches Institut, Karlsruhe Institute of Technology (KIT), Kaiserstr. 12</s1><s2>76131 Karlsruhe</s2><s3>DEU</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></inist:fA14><country>Allemagne</country><placeName><region type="land" nuts="1">Bade-Wurtemberg</region><region type="district" nuts="2">District de Karlsruhe</region><settlement type="city">Karlsruhe</settlement></placeName></affiliation></author></titleStmt><publicationStmt><idno type="inist">10-0365959</idno><date when="2010">2010</date><idno type="stanalyst">PASCAL 10-0365959 INIST</idno><idno type="RBID">Pascal:10-0365959</idno><idno type="wicri:Area/Main/Corpus">004149</idno><idno type="wicri:Area/Main/Repository">003B63</idno></publicationStmt><seriesStmt><idno type="ISSN">0947-8396</idno><title level="j" type="abbreviated">Appl. phys., A Mater. sci. process. : (Print)</title><title level="j" type="main">Applied physics. A, Materials science & processing : (Print)</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Bias voltage</term><term>Degradation</term><term>Humidity</term><term>Illumination</term><term>Impulse</term><term>Memory effect</term><term>Solar cell</term><term>Sulfonate polymer</term><term>Thiophene derivative polymer</term><term>Transient photoconductivity</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Cellule solaire</term><term>Photoconductivité transitoire</term><term>Eclairement</term><term>Effet mémoire</term><term>Tension polarisation</term><term>Humidité</term><term>Impulsion</term><term>Dégradation</term><term>Sulfonate polymère</term><term>Thiophène dérivé polymère</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">We measure the transient electrical response of small organic solar cells illuminated with nanosecond light pulses during degradation. Our data show the buildup of a significant memory effect in the pulse response. To measure this memory effect, a sequence of positive or negative bias voltages is applied and the pulse response is then recorded at 0-V bias voltage. For devices with a measurable memory effect, this pulse response depends on the previously applied positive or negative bias voltage. The memory effect is attributed to changes in the (3,4-ethylenedioxythiophene):poly (4-styrenesulfonate) (PEDOT:PSS) layer in conjunction with humidity and the indium tin oxide (ITO) layer. The strength of the memory effect depends on the anode material used and the time exposed to humid atmosphere. Therefore, the strength of this memory effect is a measure for the corresponding degradation process.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0947-8396</s0></fA01><fA03 i2="1"><s0>Appl. phys., A Mater. sci. process. : (Print)</s0></fA03><fA05><s2>99</s2></fA05><fA06><s2>4</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Organic solar cell degradation probed by the nanosecond photoresponse</s1></fA08><fA11 i1="01" i2="1"><s1>KETTLITZ (S. W.)</s1></fA11><fA11 i1="02" i2="1"><s1>VALOUCH (S.)</s1></fA11><fA11 i1="03" i2="1"><s1>LEMMER (U.)</s1></fA11><fA14 i1="01"><s1>Lichttechnisches Institut, Karlsruhe Institute of Technology (KIT), Kaiserstr. 12</s1><s2>76131 Karlsruhe</s2><s3>DEU</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ></fA14><fA20><s1>805-809</s1></fA20><fA21><s1>2010</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>16194A</s2><s5>354000193127510190</s5></fA43><fA44><s0>0000</s0><s1>© 2010 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>17 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>10-0365959</s0></fA47><fA60><s1>P</s1></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Applied physics. A, Materials science & processing : (Print)</s0></fA64><fA66 i1="01"><s0>DEU</s0></fA66><fC01 i1="01" l="ENG"><s0>We measure the transient electrical response of small organic solar cells illuminated with nanosecond light pulses during degradation. Our data show the buildup of a significant memory effect in the pulse response. To measure this memory effect, a sequence of positive or negative bias voltages is applied and the pulse response is then recorded at 0-V bias voltage. For devices with a measurable memory effect, this pulse response depends on the previously applied positive or negative bias voltage. The memory effect is attributed to changes in the (3,4-ethylenedioxythiophene):poly (4-styrenesulfonate) (PEDOT:PSS) layer in conjunction with humidity and the indium tin oxide (ITO) layer. The strength of the memory effect depends on the anode material used and the time exposed to humid atmosphere. 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